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Checks on Astrometry
The internal astrometric accuracy (between the stacked images
themselves) is typically 0.04 arcseconds radially or 0.025 in any one
direction.
The repeatability (the residuals between two completely independent
astrometric determinations), is about 0.06 arcseconds.
The external astrometric accuracy (between the stacks and
the external reference frame) is typically 0.20 arcseconds radially or
0.14 in any one direction.
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The internal accuracy is checked by running SExtractor on
each stacked image in every band of each group and obtaining catalogues
of object positions. The positional catalogues for each band are matched
to each other and common objects identified. If the astrometry
is perfect, then the position of an object in each band
will be identical. In practice, there are astrometric residuals.
Examining these residuals gives an idea of the astrometric
uncertainties.
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The figure at right shows checks on the internal
astrometry between two typical images in a group.
The top left quarter shows the direction and size (greatly enlarged)
of the astrometric residuals as line segments. This plot is an
important diagnostic of astrometry because, while the residuals are
typically quite small, there are outliers in any distribution. As long
as these outliers are relatively isolated from each other and pointing
in random directions all is well. Conversely, if there are a number of
large residuals in close proximity to each other, all pointing the
same direction, this indicates a systematic misalignment between the
two images in question. The figure shows no such misalignments.
The bottom left quarter shows the astrometric residuals in
RA and Dec. The red histograms
show the relative distribution of the residuals in
both directions. The 68th percentile of the residuals is 0.060
arcseconds radially.
The two right panels show the residuals in RA and Dec
separately.
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Over all, the astrometric residuals are about 0.04 arcseconds (68th percentile)
in a radial sense or about 0.025 in any one direction. Note that
there should be a factor of sqrt(2) between these two uncertainties.
The test described above was applied to every pair of images within each of the groups
with similar results. This of course might not be too surprising,
since the images were registered to each other in the first
place. For example, if there is g and i data in a group, the i image
is made first and then the g data is astrometrically mapped to the i
image as described here. Therefore,
even if there are systematic errors in the i astrometry, the g data is
mapped to the erroneous positions, and the residuals between the g and
i image will still be small.
However, this test is also applied between images belonging to
different groups. Since the astrometric calibration of one group is
completely independent of that of another group, comparing the
residuals between different groups is a more stringent test of the
repeatability of the astrometry. The
figure at right shows the astrometric residuals between two groups.
The different panels have the same significance as in the previous
figure. Groups tend to overlap only at the edges, in a thin strip, as
shown in the top left panel. Consequently, the number of common
sources between two groups will be much smaller than between two
stacks in the same group. The residuals in this case are 0.05 arcseconds.
More typically, averaging over all the group overlaps,
the repeatability is 0.06 arcseconds.
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This is checked by matching the catalogue
for each field back to the astrometric reference catalogue.
Again, the scatter in the astrometric residuals is a measure
of the uncertainty, and the presence of any
localized large residuals indicates a systematic shift.
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The figure at right shows checks on the external
astrometry. The panels have the same significance as above.
The only difference is that the residuals are larger.
Note that there are uncertainties in the external
astrometric catalogue as well.
In this case, the SDSS is used as
a reference. The astrometric uncertainties
inherent in the SDSS are 0.05 to 0.10 arcseconds
(Pier, et al. 2003).
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